Abstract: A test system was developed in order to study the single event effects (SEE) of the static RAM circuits and programmable peripheral interface circuits. The characteristics of the system are the good man-machine interaction, easy and visual operation. Therefore the reliable control and the data acquisition can be performed. This system is successfully applied to the investigation of SEE induced by the heavy ions produced by HI-13 tandem accelerator, such as the experimental studies of SEE for the HM1-65642 (SRAM 8K×8bit) and CMOS programmable peripheral interface ID82C55A. The SEE measurements for these two kinds of devices with 5 types of ions,~(16)O,~(35)Cl,~(56)Fe,~(79)Br, and~(127)I are carried out.