Accuracy and Sensitivity of Film Thickness Measurement by Using α-Particle Energy Loss Method
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摘要: 采用分层计算方法分析用α粒子能损法测量薄膜厚度的准确性与分层层数的关系。此关系表明,采用分层计算可使准确性提高30%。另外,分析了膜厚测量的灵敏度随α粒子能量或随薄膜厚度的变化关系,并根据这一关系提出了提高膜厚测量灵敏度的方法。Abstract: The film that its mass thickness was measured by α-particle energy loss(method) was regarded as constitute of many layers.Each layer thickness was calculated.The total film thickness was obtained by summing thickness of every layer.It is shown that this dividing layer computing method can increase the measurement accuracy by 30% for α-particles from ~(241)Am.It is also seen that the sensitivity of thickness measurement with α-particle can be improved by lowering appropriately the energy of α-particle.