Development of Pulsed X-ray Facility for Wavelength Resolved Fluorescent Lifetime Measurement
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摘要: 通过1台高效率凹面光栅单色仪的研制，在原有脉冲X射线时间谱仪的基础上，开发完成了1套光谱分辨的荧光衰减时间谱仪，其波长和时间分辨率分别可达nm和亚ns量级。由BaF2闪烁晶体的测试结果表明：谱仪可有效进行光谱分辨的发光衰减时间谱测量，加载单色仪后，谱仪的测量效率仅下降2个数量级，达到了设计所预期的指标。利用这一装置，对CeF3晶体光谱分辨的发光衰减时间谱进行了分析。Abstract: With the development of a high efficiency concave grating monochromator, a pulsed Xray facility for wavelength resolved decay time measurement is made upon the basis of original ultra short pulsed X-ray facility. The wavelength resolution and time resolution of the facility are in the scale of nanometer and subnanosecond, respectively. The study of BaF2 shows that the equipment can be applied to measure decay time of different fluorescent components from scintillator quite well. The counting rate for such measurement is only two orders of magnitude lower than for decay time spectra measurement without the monochromator. In addition, the wavelength resolved fluorescent lifetime of CeF3 scintillation crystal is studied by the facility.
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