中子辐照导致线阵电荷耦合器件电荷转移效率退化实验研究

Experimental Study on Neutron-Induced Charge Transfer Degradation of Linear Charge Coupled Device

摘要: 利用TRIGA型脉冲反应堆提供的快中子，对线阵电荷耦合器件进行中子辐照实验研究。研究结果表明：在10¹²～10¹³cm^-2中子注量范围内，该器件的电荷转移效率（CTE）随辐照中子注量的增加而线性下降；电荷转移效率的下降与电荷包在沟道中的转移时间及转移电荷包的电量有关。

Abstract: The effect of neutron irradiation on the charge transfer efficiency of the linear CCD(charge coupled device) is studied. The CCD was irradiated by the fast neutron with the fluence of 10¹²-10¹³cm^-2 from the TRIGA reactor．The charge transfer efficiency of the irradiated linear CCD is linearly decreased with the increase of neutron fluence，and the charge transfer degradation is related to the charge transfer time and the quantity in CCD’s transfer channel．