高纯氘中杂质的低温气相色谱分析

Analysis Technique of Impurity in High Purity Deuterium by Cryogenic Gas-Chromatography

摘要: 实验研究采用5A分子筛和氧化铝充填色谱柱分别在常温和低温（77 K)下对D₂中的O₂、N₂以及H₂、HD等杂质进行定量分析测量，以建立1种准确实用的分析方法。研究结果表明，该方法对H₂、HD的最低检测浓度可达（150～200）×10^－6，能够满足高纯氘制备过程中对杂质的定量分析要求。

Abstract: A veracious and applicable quantitative analysis method of O₂， N₂and H₂， HD in high purity deuterium by the chromatogram columniation filled with 5A molecular sieve and alumina was researched and constituted at natural temperature and 77 K, respectively. Minimum detecting limit of the present method is (150-200)×10^-6 for H₂ and HD, and it can meet the need of quantitative analysis of the impurity during high purity deuterium preparation.