核级设备中薄膜/基体系统Ⅱ型界面裂纹尖端场

Crack Tip Field of Mode Ⅱ Interface of Film/Substrate System for Components of Nuclear Safety

  • 摘要: 随着薄膜/基体系统在核级设备中的开发和应用,对薄膜以及薄膜/基体系统力学性能的研究显得越来越重要。本文从基本方程出发,结合对裂尖各场合理的奇异性分析,推导出了渐近控制方程。并由定解条件,采用打靶法求得了Ⅱ型裂纹裂尖的应力和应变场。此研究将为最终解决工程实践中所遇到的相应问题和建立材料的破坏准则提供理论参考。

     

    Abstract: With the exploitation and application of the film/substrate system in components of nuclear safety, it is more and more important to research the mechanical properties of film and film/substrate systems. Deriving from fundamental equation and combining with the analysis on the singularity of crack-tip fields, the asymptotic governing equations were deduced. With soluting-deterimining conditions, the stress and strain fields near the tip of mode Ⅱ crack were also obtained by using the shooting method. This paper provides a beneficial exploration for the final solutions of the corresponding problems encountered in engineering practices and building the material’s fracture rule.

     

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