Ar<sup>16+</sup>与Zr作用产生的X射线谱

Ar¹⁶⁺与Zr作用产生的X射线谱

摘要: 本工作对超导离子源（SECRAL）上的10～20 kV/q Ar¹⁶⁺和Ar¹⁷⁺入射到金属Zr表面进行实验研究。实验结果表明，高电荷态Ar16+在金属表面存在着多电子激发过程。Ar空心原子的K层发射X射线强度随入射离子的动能减少,靶原子Zr的L壳层发射X射线强度随入射离子动能的增加而增强。Ar¹⁷⁺单离子的Kα-X射线产额比Ar¹⁶⁺单离子的Kα-X射线产额大5个数量级。

Abstract: The 10-20 kV/q Ar¹⁶⁺ and Ar¹⁷⁺ ions were produced by SECRAL incidence onto metallic surface of Zr. The multi-electron excitation occurred in the process neutralization of the highly charged Ar¹⁶⁺ ions in metallic surface, which possibly produced vacancy in the K shell. Kα-X-ray yield per ion for Ar¹⁷⁺ has five orders of magnitude greater than that for Ar¹⁶⁺. The intensity of X-ray of the Ar hollow atom decreases with kinetic energy increase, and the intensity of X-ray from L shell of the target atom Zr increases with kinetic energy increase.