Abstract:
Accelerator-transmission electron microscopy(TEM) interface facility is a useful tool for the study of materials because of its in situ observation function that is applicable to the complex evolution of microstructures during ion irradiation. The first accelerator-TEM interface system in China has been established at Wuhan University, which consists of a Hitachi H800 TEM, a 200 kV ion implanter and a 2×1.7 MV tandem accelerator. The paper gives the layout of the equipment and ion optical calculation results which provide possible adjustment of the system to improve its performance. The calculation result suggests that transport efficiency of the ion beam can be enhanced by adding another duality electrostatic quadruple in company with adjusting the original magnetic quadrupoles.
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