模数转换器辐照效应测试系统研制
Development of Measurement System for Radiation Effect on A/D Converter
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摘要: 本工作研制基于柱形图分析法的模数转换器辐照效应测试系统。详细描述了系统的测试原理、系统组成、系统控制流程及系统实现的功能。利用该系统在60Co源上对商用12位AD574AJD芯片进行了总剂量效应试验。结果表明，系统所测的ADC器件的静态参数及功能参数能正确反映器件的效应损伤情况，是一良好的ADC器件辐照效应测试平台Abstract: A measurement system for radiation effects on analogtodigital (A/D) converter based on histogram method was developed. Testing principle, system composition, control flow and systemic function were described. Total dose effects experiment of 12 bit AD574AJD using the system was carried out on 60Co source to verify its effectivity. The results show that the static parameters and functional parameters gained by the system can accurately reflect the damage effect of the devices under test. So the system is a well test bench for radiation effects on A/D converter.
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