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EAST全超导托卡马克上硅漂移探测器软X射线能谱诊断

Diagnostic of Soft X-ray Energy Spectrum Based on Silicon Drift Detector in EAST Fully-Superconducting Tokamak

    摘要
  • 摘要: 采用性能优越的15道硅漂移探测器（SDD）阵列，在EAST全超导托卡马克上建立了1套较为完善的软X射线能谱诊断系统，用以测量等离子体在软X射线辐射能段(1～20 keV)的能谱。该诊断系统的观测范围基本覆盖了整个等离子体空间，因此，可满足EAST不同放电位形下电子温度测量的要求。利用该诊断系统，可获得时间分辨达50 ms、空间分辨约为7 cm的电子温度剖面。通过对比发现，由该诊断系统所得到的电子温度与其它电子温度诊断系统所测量的电子温度基本一致。此外，该诊断系统还可监测在软X射线能量范围内出现的一些金属杂质的特征线辐射。

     

    Abstract: A set of diagnostic system of soft X-ray energy spectrum, based on a high performance silicon drift detector (SDD) linear array including 15 SDDs, was established for measuring the plasma soft X-ray (1-20 keV) spectra on the EAST fully-superconducting Tokamak. The diagnostic system basically views all the plasma space and can measure electron temperature under various plasma configuration conditions. The profile of electron temperature with 50 ms time-resolution and about 7 cm spatial resolution can be obtained by means of the system. It is observed that the electron temperature derived from the system is consistent with those from other diagnostic systems. In addition, the characteristic line emissions of some metallic impurities fallen in the soft X-ray energy range can also be detected by the system.

     

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