Abstract: With technology feature sizes decreasing, dependent current source method is checked to induce great difference from practical SET pulses. Results consistent with experiments can be obtained by mixed-mode simulation. However, mixed-mode simulation is proved to be time-consuming in soft errors analysis of large scale combinational logic circuits. Accordingly, circuit-level fast SET pulse injection method is needed. This paper implemented coupled SET pulse injection method based on 2D look-up table for 0.18 μm CMOS inverter. It is proved that coupled SET pulse injection results comply with mixed-mode simulation results well. Moreover, coupled SET pulse injection is three orders faster than mixed-mode simulation.