Abstract: Current-feedback amplifier (CFA) based on the complementary bipolar processes was irradiated by ⁶⁰Co γ of low and high dose-rates under different biases. The damage varies with the biases and dose-rates. Irradiated with all pins grounded, the device gets more degradation at low dose rate than that at high dose rate. It exhibits enhanced low dose rate sensitivity (ELDRS). But the degradation is small under low supply voltage, and the difference between low and high dose-rates is not obvious. While under high supply voltage, the damage is severer at high dose rate than low dose rate, and it rebounds after irradiation annealing experiment，which is time-dependent effects. The ELDRS of bipolar device is related to the biases during the irradiation.