凸度仪双排阵列气体电离室探测器的设计与研制

Design and Development of Dual-array Gas Ionization Chamber Detector in Profile Gauge

  • 摘要: 为提高凸度仪系统的稳定性与可靠性,更好地适应恶劣的现场环境,采用气体电离室作为凸度仪的探测器。本文分析了气体电离室探测器的特点,对电离室结构进行了研究与设计,阐述了“双排阵列”这一特点,并对阵列布置方式进行了研究。最终设计出的水平布置的双排阵列气体电离室探测器满足了凸度仪系统的要求,且提高了系统的分辨率及重建精度。

     

    Abstract: In order to improve stability and reliability of the profile gauge system and to fit the harsh on-line environment better, the gas ionization chamber was used as detector of the profile gauge. In this article, the characteristic of the ionization chamber was analyzed and the structure of the chamber was studied and designed. The feature of ‘dual-array’ was discussed and the arrangement mode of the array was studied. The dual-array gas ionization chamber detector designed eventually meets the requirements of the profile gauge and increases the resolution and reconstruction precision of the system.

     

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