Abstract:
The
in-situ test system of transient ionizing radiation effects for operational amplifier was established to study the response to transient ionizing irradiation. Three different bipolar operational amplifiers with different bandwidths and slew rates were irradiated using the Qiangguang-Ⅰ accelerator in Northwest Institute of Nuclear Technology. The results show that the response time decreases, as the bandwidth and the slew rate of the bipolar operational amplifiers increase for the same dose rate. Analysis indicates that the slew rate is related to the compensation capacitor for the bipolar operational amplifier with inside compensation capacitor. The smaller the compensation capacitor is, the greater the slew rate is.