MeV离子轰击碳样品引起的碳氢团簇产额

Production Yield of C-H Cluster From Carbon Material Bombarded by MeV Ions

摘要: 利用北京大学2×1.7 MV静电串列加速器产生的1.5 MeV Au²⁺和Si⁺束流轰击碳纳米管样品，用二次离子飞行时间质谱方法分析了二次离子成分，通过质量已知的样品的定标，确认了轰击产生的二次离子质量。分析束流轰击后的二次离子产额，发现在此能量下二次离子产额与离子在物质中射程的横向歧离表现出正相关。

Abstract: Using the time-of-flight secondary ion mass spectrometry method, the production yield of C-H cluster from carbon material bombarded by MeV ions was investigated. In the experiment, Si⁺and Au²⁺ ions generated by the 2×1.7 MV tandem accelerator of Peking University were chosen as the primary ion beams. The mass of the secondary ion was calibrated by the sample with known mass. By analyzing the mass spectrum of the secondary ion bombarded by different ions, it is found that the yield is related to the lateral straggling of ions in the material at this energy region.