高电荷态重离子束流产生技术的研究

Technique of Producing High Charge State Heavy-ion Beam

摘要: 为了提高北京HI-13串列加速器束流的硅中射程和LET值，本文开展了高电荷态束流引出技术及pA级弱束流诊断技术研究。采用电刚度和磁刚度模拟技术，配合pA级弱束流束斑观测和束流强度监测技术，获得能量360 MeV、峰总比80%的¹⁹⁷Au离子束流，其在Si中的表面LET为86.1 MeV•cm²•mg^-1、射程为30.1 μm，满足单粒子效应（SEE）实验的要求，拓展了北京HI-13串列加速器上单粒子效应实验所用离子的能量和LET值范围。

Abstract: In order to get the Beijing HI-13 tandem accelerator beam with the higher range and LET in silicon, the techniques of beam route simulating and pico-ampere beam diagnosing were developed. The magnetic rigidity simulation and electric rigidity simulation techniques combined with beam spot observing and beam intensity measuring techniques were used for getting 360 MeV ¹⁹⁷Au ion beam with the peak-to-total ratio of 80% in the spectrum. The range of 360 MeV¹⁹⁷Au in silicon is 30.1 μm and the LET is 86.1 MeV•cm²•mg^-1. This meets the requirement of single-event effect test, and the beam energy range and LET range in Beijing HI-13 tandem accelerator have been obviously enlarged.