半导体夹心谱仪测量裂变中子能谱的不确定度

Uncertainty of Neutron Spectra for Semiconductor Sandwich Spectrometer

摘要: 本文通过对中子能谱的不确定度的阐释，明确提出了中子能谱的不确定度应理解为能区份额或某一能量范围内中子注量（率）的不确定度。以⁶Li夹心半导体中子谱仪测量CFBR-Ⅱ堆泄漏中子谱为例，对3个典型能区的中子注量率谱的不确定度进行了分析。当全谱中子注量率为3.00×10⁷cm^-2•s^-1时，0～20 keV能区内的中子注量率为5.70^+2.38_-0.33×10⁵ cm^-2•s^-1(不确定度中的包含因子k=1)，0.59～0.61 MeV能区内的中子注量率为(4.32±0.87)×10⁵ cm^-2•s^-1(k=1)，4.99～5.01 MeV能区内的中子注量率为0.094^+0.028_-0.022×10⁵ cm^-2•s^-1(k=1)。

Abstract: The uncertainties of neutron spectra were defined to be the uncertainties of the neutron fluences or fluence rates for certain energy ranges in this paper. The neutron fluence rate spectra by ⁶Li semiconductor sandwich spectrometer were analyzed and the uncertainties of three typical energy ranges were presented. For total neutron fluence rate of 3.00×10⁷cm^-2•s^-1, the neutron fluence rates are 5.70^+2.38_-0.33×10⁵cm^-2•s^-1(k=1), (4.32±0.87)×10⁵cm^-2•s^-1(k=1) and 0.094^+0.028_-0.022×10⁵cm^-2•s^-1(k=1) for energy ranges of 0.20 keV, 0.59-0.61 MeV and 4.99-5.01 MeV, respectively.