高分辨率X射线探测器读出电子学系统的研制及性能测试

Development and Performance Evaluation of Read-out Electronics System for High Resolution X-ray Detector

摘要: 本文针对光锥耦合X射线探测器低噪声的设计要求，研制了一套读出电子学系统，该系统包括模拟驱动电路、前端处理电路及基于现场可编程门阵列（FPGA）的数字信号处理电路。利用X射线成像平台，对研发的探测器进行了性能测试。探测器系统绝对增益为0.168 6 DN/e^-，线性工作范围为0～154 μGy。制冷温度为-20 ℃时，暗电流噪声为0.037 e^-/（pixel•s），读出噪声为10.9 e^-。探测器的本征空间分辨率达16 lp/mm。测试结果表明，研制的读出电子学系统能满足高分辨率X射线探测器对低噪声特性的需求。

Abstract: An electronics system was developed according to the low noise requirement of FOT X-ray detector in this paper. The electronics system consists of an analog drive circuit, a front end processing circuit and a digital signal processing circuit which is based on field programmable gate array (FPGA). The performance of FOT X-ray detector was evaluated on the X-ray imaging platform. The overall system gain is 0.168 6 DN/e^-, and the linear operating range of the detector is 0.154 μGy. When the cooling temperature reaches -20 ℃, the dark current noise is 0.037 e^-/（pixel•s） and the read noise is 10.9 e^-. The intrinsic spatial resolution of the detector is 16 lp/mm. The results indicate that the designed read-out electronics system meets the requirements of high resolution X-ray detector.