钝化层结构对氚辐伏电池转换性能的影响

雷轶松, 杨玉青, 刘业兵, 李昊, 王关全, 罗顺忠

雷轶松, 杨玉青, 刘业兵, 李昊, 王关全, 罗顺忠. 钝化层结构对氚辐伏电池转换性能的影响[J]. 原子能科学技术, 2015, 49(7): 1338-1344. DOI: 10.7538/yzk.2015.49.07.1338
引用本文: 雷轶松, 杨玉青, 刘业兵, 李昊, 王关全, 罗顺忠. 钝化层结构对氚辐伏电池转换性能的影响[J]. 原子能科学技术, 2015, 49(7): 1338-1344. DOI: 10.7538/yzk.2015.49.07.1338
LEI Yi-song, YANG Yu-qing, LIU Ye-bing, LI Hao, WANG Guan-quan, LUO Shun-zhong. Influence of Passivation Layer Structure on Energy Conversion Property of Tritium Beta-voltaic Battery[J]. Atomic Energy Science and Technology, 2015, 49(7): 1338-1344. DOI: 10.7538/yzk.2015.49.07.1338
Citation: LEI Yi-song, YANG Yu-qing, LIU Ye-bing, LI Hao, WANG Guan-quan, LUO Shun-zhong. Influence of Passivation Layer Structure on Energy Conversion Property of Tritium Beta-voltaic Battery[J]. Atomic Energy Science and Technology, 2015, 49(7): 1338-1344. DOI: 10.7538/yzk.2015.49.07.1338

钝化层结构对氚辐伏电池转换性能的影响

Influence of Passivation Layer Structure on Energy Conversion Property of Tritium Beta-voltaic Battery

  • 摘要: 在辐射伏特效应同位素电池(辐伏电池)中,器件的辐伏转化性能不仅受限于换能器件所用的半导体材料、结构或加载放射源的种类,还受换能器件表面钝化层结构的影响。为在氚化钛源加载的平面单晶硅PN结辐伏电池(氚辐伏电池)中得到最佳的钝化效果,本文设计了3种不同的钝化层结构,考察其初始输出性能和抗辐射性能,并单独研究了氚化钛源出射的X射线对单晶硅换能器件的辐射损伤。结果显示:在辐伏电池初始输出性能方面,Si/SiO2/Si3N4结构>Si/B-Si glass/Si3N4结构>Si/Si3N4结构;在抗氚化钛源辐射损伤方面,Si/Si3N4结构>Si/B-Si glass/Si3N4结构>Si/SiO2/Si3N4结构,Si/B-Si glass/Si3N4结构具有最佳的抗X射线辐射衰减性能。氚化钛源出射的X射线对辐射损伤效应起主要作用,XPS结果显示,X射线长时间辐照造成了单晶硅表面平整性的破坏。

     

    Abstract: The energy conversion property of beta-voltaic battery is not only decided by the material and structure of energy conversion device and the kind of radiation source, passivation layer also has significant influence on the radiation resistance and the initial output property. In order to realize the optimized passivation property in plain c-silicon PN beta-voltaic battery with tritide titanium source (tritium beta-voltaic battery), three kinds of passivation layers were designed to testify the radiation resistance and initial output properties. The radiation damage from the X-ray emitted from tritide titanium source was investigated individually. The initial output properties from the optimized to worst rank are as follow: Si/SiO2/Si3N4 structure>Si/B-Si glass/Si3N4 structure>Si/Si3N4 structure, and for the radiation resistance, Si/Si3N4 structure>Si/B-Si glass/Si3N4 structure>Si/SiO2/Si3N4 structure, and the Si/B-Si glass/Si3N4 structure has the optimal radiation resistance under the pure X-ray irradiation. The X-ray emitted from tritide titanium source is the main reason for radiation damage and the results from XPS detection show that the surface of c-silicon is broken by pure X-ray irradiation.

     

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  • 刊出日期:  2015-07-19

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