[1] |
WINDLE W F. 147Pm-silicon betavoltaic battery feasibility[R]. US: Sandia Corp., 1966.
|
[2] |
罗顺忠,王关全,张华明. 辐射伏特效应同位素电池研究进展[J]. 同位素,2011,24(1):1-11.LUO Shunzhong, WANG Guanquan, ZHANG Huaming. Advance in radiation-voltaic isotope battery[J]. Journal of Isotopes, 2011, 24(1): 1-11(in Chinese).
|
[3] |
HONSBERG C B, DOOLITTLE W A, ALLEN M, et al. GaN betavoltaic energy converters[C]∥Conference Record IEEE Photovoltaic Specialists Conference. US: IEEE, 2005.
|
[4] |
王关全,杨玉青,张华明. 辐射伏特效应同位素电池换能单元设计及其性能测试[J]. 原子能科学技术,2010,44(4):494-498.WANG Guanquan, YANG Yuqing, ZHANG Huaming. Design and performance of energy conversion units of betavoltaic isotopic batteries[J]. Atomic Energy Science and Technology, 2010, 44(4): 494-498(in Chinese).
|
[5] |
SCHOENFELD D W. Design optimization of radionuclide nano-scale batteries[C]∥Americas Nuclear Energy Symposium. [S. l.]: [s. n.], 2004.
|
[6] |
AKKERMAN A. Updated NIEL calculations for estimating the damage induced[J]. Radiation Physics and Chemistry, 2001, 62: 301-310.
|
[7] |
LIU Y, HU R, YANG Y, et al. Investigation on a radiation tolerant betavoltaic battery based on Schottky barrier diode[J]. Appl Radiat Isot, 2012, 70: 438-441.
|
[8] |
SANTOS I, MARQUES L A, PELAZ L, et al. Molecular dynamics study of damage generation mechanisms in silicon at the low energy regime[C]∥2007 Spanish Conference on Electron Devices. US: IEEE, 2007: 37-40.
|
[9] |
SIDHU L S, KOSTESKI T, ZUKOTYNSKI S, et al. Effect of dangling-bond density on luminescence in tritiated amorphous silicon[J]. Applied Physics Letters, 1999, 74(26): 3975-3977.
|
[10] |
ROTHWARF F. Metal-tritium nuclear batteries: United State, WO 20071027589 A1[P]. 2007-03-08.
|
[11] |
STESMANS A, SOMERS P, AFANAS’EV V V, et al. Inherent density of point defects in thermal tensile strained (100)Si/SiO2 entities probed by electron spin resonance[J]. Applied Physics Letters, 2006, 89: 152103/1-152103/3.
|
[12] |
WANG G Q, HU R, WEI H Y, et al. The effect of temperature changes on electrical performance of the betavoltaic cell[J]. Appl Radiat Isot, 2010, 68: 2214-2217.
|
[13] |
LI H, LIU Y B, HU R, et al. Simulations about self-absorption of tritium in titanium tritide and the energy deposition in a silicon Schottky barrier diode[J]. Appl Radiat Isot, 2012, 70: 2559-2563.
|
[14] |
SROUR J R. Review of displacement damage effects in silicon[J]. IEEE Trans Nucl Sci, 2003, 50(3): 653-670.
|
[15] |
高晖,王和义,张华明,等. 单晶硅低能电子束辐照效应[J]. 材料科学与工程学报,2011,29(2):272-276.GAO Hui, WANG Heyi, ZHANG Huaming, et al. The low enery electron radiation effect in c-silicon[J]. Journal of Material Science and Technology, 2011, 29(2): 272-276(in Chinese).
|
[16] |
WAGNER C. X-ray photoelectron spectroscopy with X-ray photons of higher energy[J]. Journal of Vacuum Science and Technology, 1978, 15: 518-523.
|
[17] |
KOOI E. The surface properties of oxidized silicon[M]. Germany: Springer Berlin Heidelberg, 1967.
|