Flash型FPGA的单粒子效应测试系统研制

Development of Single-event Effect Test System for Flash-based FPGA

摘要: 研制了一套Flash型FPGA的单粒子效应测试系统，其具有片上SRAM/Flash ROM单粒子翻转效应测试、D触发器单粒子效应测试、锁相环与时钟网络单粒子瞬态效应测试、单粒子瞬态脉冲宽度测试等功能。本文介绍了该系统的测试原理和软硬件实现方法。

Abstract: A single-event effect test system for Flash-based FPGA was developed. The system can be used for SRAM/Flash ROM single-event upset effect test, D-flip flop single event effect test, PLL and clock network single-event transient effect test, and single-event transient pulse width test. The test methods and hardware/software solutions were described in this paper.