基于APV25读出电子学系统的GEM探测器的位置分辨与X射线成像研究

Study of Spatial Resolution and X-ray Imaging of GEM Detector Based on APV25 Readout Electronics System

摘要: 采用3层GEM膜制作了有效面积为10 cm×10 cm的GEM探测器，该探测器采用二维条读出方式，条间距为400 μm，每个维度有256个读出通道。探测器的读出采用APV25读出电子学系统，根据GEM探测器的需要，设计并改进了电子学系统使用的背板连接器。实验测得GEM探测器空间分辨为76 μm。进行了X射线二维成像研究，获得了清晰的二维图像，探测器与电子学运行稳定可靠。

Abstract: A 10 cm×10 cm GEM detector was made by three-layer GEM foils. The 2D strip readout mode was used and each dimension has 256 channels with pitch of 400 μm. The APV25 front-end readout chip was introduced in the detector, and the backplane connectors were improved in order to adapt the electronics system with GEM detector. The detector achieved the experimental spatial resolution of 76 μm. In 2D X-ray imaging experiment, the clear image was obtained, which indicates the good working reliability of the GEM detector and electronics.