基于X-pinch丝负载的背光照相研究

Study on X-ray Backlighting of Wire Load X-pinch

  • 摘要: 以天光Ⅱ-B装置(250 kA/50 ns)作为实验平台,在装置负载的阴阳极和回流盘上同时安装X-pinch丝负载,利用天光Ⅱ-B驱动X-pinch丝负载,通过背光照相实验获得箍缩发展不同时刻的序列图像。在序列图像中可观察到箍缩叉点处等离子体的内爆及外爆消散。实验结果有助于进一步理解丝负载箍缩等离子体发展的物理机制。

     

    Abstract: The experiments were carried out on the pulsed power generator Light Ⅱ-B (250 kA/50 ns). The wire load X-pinch was installed on the cathode and anode of the device and the current-return rod. Light Ⅱ-B was used to drive the wire load X-pinch. A series of backlighting images could be clearly seen at different moments during wire load X-pinch discharge. The implosion and explosion of plasma near the cross point of the wire load X-pinch can be seen. The study can provide a better understanding about plasma physics formation of wire load X-pinch.

     

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