用于激光产生的高能X射线源能谱诊断的滤片堆栈谱仪的研制

Development of Filter Stack Spectrometer for Spectrum Measurement of X Ray Generated by Laser

  • 摘要: 为了诊断基于激光的短脉冲、高强度的高能X射线源能谱特性,本文利用不同材料和厚度的金属滤片和记录介质研制了一套滤片堆栈谱仪。基于Greval算法发展了能谱反解程序,并使用蒙特卡罗程序Geant4模拟得到了谱仪的响应函数。在星光Ⅲ激光装置上验证了谱仪的可靠性,获得了ps激光与固体靶相互作用产生的10 keV~3 MeV轫致辐射能谱,从而验证了谱仪的可靠性。

     

    Abstract: To measure the spectra of intense pulsed X ray generated in laser target interaction, a filter stack spectrometer composed of metal filters and image plates with different materials and thicknesses was developed. A code based on Greval algorithm was developed to unfold the spectra from measured data. The response function was calculated with Monte Carlo simulation code Geant4. This spectrometer was tested in a picosecond laser-solid target experiment at XG Ⅲ laser facility and the bremsstrahlung spectra from 10 keV to 3 MeV were obtained. The result shows that the spectrometer is reliable.

     

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