240Am半衰期的测量

Measurement of Half-life of 240Am

  • 摘要: 240Am的半衰期对准确测量241Am(n,2n)240Am反应截面具有重要作用,当前评价的数据50.8(3) h是对240Am的987.8 keV γ射线用Ge(Li)探测器跟踪测量6 d的结果,测量时间不到3个半衰期,使得测量结果的不确定度偏大。本文利用Geant4模拟软件建立了阱型HPGe探测器的测量模型,模拟计算了不同Pb吸收厚度下240Am高能γ射线的探测效率,确定使用阱型HPGe探测器配合吸收X射线和低能γ射线的Pb吸收体可有效提高240Am高能γ射线的探测效率。根据Geant4模拟计算的结果,Pb吸收体厚度为1 mm时,对240Am的888.8 keV和987.8 keV两条特征γ射线的探测效率分别为14.1%和13.3%。在中国原子能科学研究院的HI-13串列加速器上通过242Pu(p,3n)反应生产了240Am,制备了约700 Bq的240Am测量源,用上述方法跟踪测量240Am的888.8 keV和987.8 keV两条特征γ射线的强度,时间超过18 d,用最小二乘法拟合得到其半衰期为50.79(5) h,结果与评价结果一致,但减小了不确定度。

     

    Abstract: The half-life of 240Am is of importance to determine the cross section of neutron reaction 241Am(n, 2n) 240Am and the currently evaluated datum is 50.8(3) h, which is an experimental result by monitoring the intensity of 987.8 keV γ-ray with a Ge(Li) detector over a period of 6 d, less than 3 times of the half-life of 240Am. In this work, the detection efficiency of the high energy γ-rays for 240Am increases greatly by using a well-type HPGe detector and an absorber made of Pb to attenuate the X-rays and low energy γ-rays. According to the simulation result from Geant4, the detection efficiency of the 888.8 keV and 987.8 keV γ-rays for 240Am are 14.1% and 13.3% when the thickness of Pb absorber is 1 mm. Recently, about 500 μg 242Pu was irradiated by protons on HI-13 tandem accelerator in China Institute of Atomic Energy to produce 240Am by the reaction of 242Pu(p, 3n) 240Am. The solution source containing 240Am about 700 Bq was measured with the well-type HPGe detector. The intensities of 888.8 keV and 987.8 keV γ-rays for 240Am were measured continuously more than 18 d and the half-life of 240Am is calculated to be 50.79(5) h by least square method, which is consistent with the evaluated datum.

     

/

返回文章
返回