Abstract:
The synergistic effect of total ionizing dose (TID) and single event transient (SET) in bipolar voltage comparator LM2903 was studied by temperature switching irradiation method which can simulate low-dose-rate irradiation. The result shows that TID has a suppressing effect on the SET of LM2903 at the high-level working state for bias voltage, and TID can promote the SET of LM2903 at the low-level working state for bias voltage. The interface state defect charge induced by ionizing irradiation is the fundamental cause of the synergistic effect of TID-SET. The output stage structure of voltage comparator causes different effects of the bias state on the synergistic effect of TID-SET.