W/BDD薄膜电极制备及其电化学性能研究

Fabrication and Electrochemical Property of W/BDD Film Electrode

  • 摘要: 利用化学气相沉积(CVD)法研制了一种钨基硼掺杂金刚石(W/BDD)薄膜电极,通过扫描电镜和Raman光谱考察了W/BDD薄膜电极的性能,通过电化学方法测定了其在LiCl-KCl熔盐中的电化学窗口和电化学性能。结果表明,研制的W/BDD薄膜电极的BDD薄膜有较好的微观结构;W/BDD薄膜电极在LiCl-KCl熔盐中的电化学窗口约为3.5 V(-2.5~1.0 V,相对于Ag/AgCl参比极电位);电解过程中,氧离子不与W/BDD薄膜电极表面BDD薄膜层的碳反应,直接被氧化为氧原子;长时间电解不会改变电极表面薄膜层的形貌和结构。

     

    Abstract: Tungsten substrate boron-doped diamond (W/BDD) film electrode was developed by chemical vapor deposition (CVD) method. The property of W/BDD film electrode was investigated by SEM and Raman. The electrochemical window and electrochemical property of W/BDD film electrode were measured in LiCl-KCl molten salt. The results show that the developed W/BDD film electrode has better microstructure. The electrochemical window of W/BDD film electrode is about 3.5 V(-2.5-1.0 V, vs Ag/AgCl). O2- doesn’t react with carbon of boron-doped diamond film, and it is oxidated directly to oxygen atom. Morphology and microstructure of BDD film are not changed after long time electrolysis.

     

/

返回文章
返回