基底偏压调控超薄PI薄膜表面铜涂层的结构和性能

Structure and Property of Cu Coating on Ultra-thin PI Film Surface Regulated by Substrate Bias Voltage

  • 摘要: 以真空镀膜技术实现超薄聚酰亚胺薄膜的表面金属化是现阶段的重要发展方向,施加负偏压是调控沉积离子能量的关键手段。利用直流磁控溅射镀膜方法在25 μm厚聚酰亚胺薄膜上以不同负偏压功率沉积金属铜涂层,研究了负偏压功率对铜层表面形貌、物相结构、化学成分等微观性能的影响,对涂层样品展开了电性能、膜基结合强度等宏观性能测试及分析。研究结果表明,随着负偏压功率的增加,涂层表面微凸体的数量和尺寸逐渐减少,涂层趋于平整致密,晶粒变得更细小,涂层中游离氧和吸附氧含量降低,氧更多地以晶格氧的形式存在。经测试,在负偏压功率为0.1 kW时,铜层方阻为3.2 mΩ/sq、结合强度为6.08 MPa,铜层表现出最优的宏观性能。然而,过高的负偏压可能会导致蚀刻、反溅射和残余应力等不利因素,使涂层产生微裂纹和孔隙等缺陷,表现为涂层微观和宏观性能降低。

     

    Abstract: Surface metallization of ultrathin polyimide films is an important development direction in the field of microelectronics, and the deposition of high-performance metal coatings on the surface of ultrathin polyimide films by vacuum coating technology is a key technology that has been widely concerned and studied. But the bonding strength between the substrate and the coating is unsatisfactory due to the large difference in physical and chemical properties and poor compatibility between the PI and copper, which will become a source of microcracks at the interface and limitations on the service life of the coating. The most efficient solution to this problem is to energize the deposited ions by applying a negative bias voltage. Cut the PI films into long strips of 20 mm×200 mm, ultrasonically clean them with acetone and anhydrous ethanol. The filamentless bar-Hall ion source was used to generate a low-energy, wide-amplitude, and large-current ion beam for glow sputtering cleaning and plasma activation under the vacuum condition of 3×10−3 Pa, and then metallic copper films were deposited by DC magnetron sputtering coating method, in which the target current was 2.5 A, the applied negative bias power was 0, 0.05, 0.1 and 0.2 kW, respectively, and the thickness of the copper film was 1 mm. Then, the scanning electron microscope (FEI-NOVA NANO 230 type) and the energy spectrometer (X-MAX5 type) were used to observe the microstructure and composition of the metallic copper layer. The X-ray diffractometer (EMPYREAN) and X-ray photoelectron spectroscopy (XPS) methods were used to examine the phase composition of the coating. The RTS-5 dual electrodynamic four-probe was used to test the thin layer square resistance of the coating. The results show that as the negative bias power increases, the copper coating becomes more and more flat and dense, the tiny convexities on the coating surface become less and smaller, the grains become finer, the free and adsorbed oxygen content in the coating decreases, and the oxygen exists more in the form of lattice oxygen. The macroscopic properties of the copper layers were optimized at a negative bias power of 0.1 kW, i.e., a square resistance of 3.2 mΩ/sq and a bond strength of 6.08 MPa. However, a high negative bias above a certain range will likely lead to unfavorable factors such as etching, back-sputtering, and residual stresses, causing defects such as microcracks and pores to develop in the coating, and degrading the coating’s microscopic and macroscopic properties instead.

     

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